Has obtained 3 invention patents, 6 utility model patents,

1 design patent and 1 software copyright

Hall Effect Test System (Hall Effect Test System) is based on Van der Pauw's law to measure the electrical transport properties and main parameters of materials, such as carrier concentration, mobility, resistivity, Hall coefficient, etc., thin film or thin layer materials are all Measurable, can be applied to all semiconductor materials, including Si, ZnO, SiGe, SiC, GaAs, InGaAs, InP, GaN (N-type & P-type can be measured), widely used in domestic universities, research institutes, semiconductors, metals, high heat Lead organic new materials and other industries.

The Van der Pauw method is specially designed for measuring two-dimensional samples of arbitrary shape. The characteristic of this method is that it does not need to know any size of the sample. The Van der Pauw equation often calculates the resistivity and Hall coefficient through a set of resistance measurements. The equation assumes that there is a contact point on the edge of the sample. The Van der Pauw method can be applied to the measurement of the resistivity of samples of any shape. It requires that the sample is uniform and there should be no holes in the middle, and the four probes are located at the edge of the sample and are small enough.

1. Adopt high-precision constant current source and voltmeter to ensure good accuracy and high stability of the instrument test, and superior performance.

2. Automatically control the direction of the magnetic field, which is more convenient and accurate.

3. The sample clamping method is fast and convenient, and adapting fixtures are provided according to different pieces.

(Utility Model Patent Patent Number: 201820041860.3)

1. Automatically switch the signal device, which can reduce the introduction of signal noise.

2. Automatic signal switching between resistivity and Hall effect can be realized.

3. Automatic adaptation/detection of sample current can be realized.

(Appearance design patent patent number: 201730242932.1)

1. The industrial appearance of the product adopts an integrated and precise design and incorporates a humanized design concept.

2. The overall appearance is smooth and generous, not only pleasing to the eye but also easy to operate.

3. Optimize many details, and add a function table to make the operation more concise and faster.

4. The product is small in size, which is convenient for experimental operation and use.

(Software copyright patent number: 2017SR045365)

1. One-key quick test, no need to set built-in parameters, making the test process more convenient and faster.

2. Provide raw data and result data, and export TXT/Excel format files.

3. The intelligent user interface and the software platform have complete functions, bringing customers a friendly operating experience.

In October 2017, the "Hall Effect Test System (HET)" of Wuhan Jiayitong Technology passed the product acceptance and was officially delivered to Chengdu University of Technology. During the after-sales return visit to the customer service department of Jiayitong, the teacher from Chengdu University of Technology said that the Hall effect test system of Jiayitong has greatly helped their experiments. The test results are relatively stable and reliable, and the instrument is small in size and convenient for experimental use. .

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