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Jiayitong invites you to the 13th China-US Chinese Nano Forum
- Categories:News
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- Time of issue:2018-06-29
- Views:156
(Summary description)The 13th China-US Chinese Nano Forum
Chinese Nano Annual Top Event
China·Chengdu, we are here for you
Jiayitong invites you to the 13th China-US Chinese Nano Forum
(Summary description)The 13th China-US Chinese Nano Forum
Chinese Nano Annual Top Event
China·Chengdu, we are here for you
- Categories:News
- Author:
- Origin:
- Time of issue:2018-06-29
- Views:156
The 13th China-US Chinese Nano Forum will be held from June 29th to July 3rd, 2018 at the Intercontinental Hotel Paradise, Chengdu Global Center. At that time, Jiayitong will join hands with Chengdu office-Jiaruitong Technology, and partner-Yiguang Technology to participate in the meeting, and show the "Thin Film Thermoelectric Parameters of Seebeck Coefficient and Resistivity of Thin Film Materials by Jiayitong" on site. We sincerely welcome colleagues from all walks of life to visit the Jiayitong booth for guidance.
Conference details
Since its establishment in 2006, the Sino-US Chinese Nano Forum has received extensive attention at home and abroad, and its influence has expanded rapidly. This forum was jointly organized by Southwest Jiaotong University and Sichuan University, with the theme of "Nanoscience and Frontier Technology".
Content of meeting
The conference will conduct academic exchanges on topics such as nano creation and function, nano energy and environment, nano biology and medicine, nano materials and characterization; at the same time, arrange topics such as nano medical applications, nano energy and environment, quantum dots and perovskite Discussion and poster presentation.
Meeting information
Forum time: June 29-July 3, 2018
Forum address: Intercontinental Hotel, Chengdu Global Center Paradise
Organizer: Sino-US Chinese Nano Forum Group Accepted
Organizers: Southwest Jiaotong University, Sichuan University
[Thin film thermoelectric parameter test system] and [Infrared annealing furnace]
[Thin film thermoelectric parameter test system]: l The thin film thermoelectric parameter test system MRS-3, specifically for the Seebeck coefficient and resistivity measurement of thin film materials, adopts dynamic method to measure Seebeck coefficient, avoids the systematic error of static measurement in temperature difference measurement, adopts The four-wire method measures resistivity, which is more accurate and convenient.
[Infrared Annealing Furnace]: Infrared annealing furnace IRLA-1200, using infrared radiation heating technology and a high-precision temperature control system, the instrument can quickly heat up to 1150 ℃ within 24 seconds, the fastest heating rate can reach 50 ℃ / s, temperature control The accuracy can reach ±0.1℃, which can realize rapid heating and annealing of samples, which plays an important role in RTP research work related to new materials.
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