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[National Lottery] Jiayitong invites you to the material conference, and the lucky prize is waiting for you! !
- Categories:Feature News
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- Time of issue:2019-07-10
- Views:23
(Summary description)The annual China Materials Conference will officially kick off on July 11 in Chengdu, China.
[National Lottery] Jiayitong invites you to the material conference, and the lucky prize is waiting for you! !
(Summary description)The annual China Materials Conference will officially kick off on July 11 in Chengdu, China.
- Categories:Feature News
- Author:
- Origin:
- Time of issue:2019-07-10
- Views:23
The annual China Materials Conference will officially kick off on July 11 in Chengdu, China.
As a global leader in the analysis and testing of the physical properties of thin film materials, Jiayitong Technology was invited to participate in this conference. The "Infrared Annealing Furnace", "Liquid Nitrogen Cryostat" and "Infrared Annealing Furnace", "liquid nitrogen cryostat" and " "Portable Zebeck Tester", "Thin Film Thermoelectric Parameter Test System" and many other best-selling equipment. Jiayitong sincerely welcomes relevant leaders, guests, teachers and friends who are engaged in material research to visit and guide at Jiayitong's booth (booth number: D40)!
The "China Materials Conference 2019" is scheduled to be held in Chengdu, Sichuan Province from July 10-14, 2019. The conference was initiated and hosted by the Chinese Society for Materials Research. The conference has 42 sub-venues and 1 materials forum. The content of the call for papers covers energy materials, environmental materials, advanced structural materials, functional materials, basic materials research and other materials. In addition, materials education forums and materials analysis and testing technology exhibitions were also held at the same time.
Jiayitong has prepared a generous gift for everyone at this conference. From July 11th, a three-day lucky draw will be held. Simply complete the trilogy as shown in the figure below to successfully participate in the draw! ! ! All experts, scholars, teachers and students are welcome to come to booth D40 to participate in the wonderful lucky draw. Apart from academic exchanges, they can get an extra surprise and happiness.
(Raffle promotion poster)
Many friends will ask where the booth is,
You can find us by following the schematic diagram given to you by the editor (as shown below)!
We will be waiting for you at D40 on July 11, see you there or leave!
(Schematic diagram of booth)
[Infrared annealing furnace]: The infrared annealing furnace IRLA adopts infrared radiation heating technology and a high-precision temperature control system, which can realize rapid heating and annealing of samples, which plays an important role in RTP research related to new materials.
[Liquid nitrogen cryostat]: The liquid nitrogen cryostat LNT uses the principle of steady-state bubbles to keep the sample in a low temperature environment that is constant or changes in a required manner, and can measure one or more physical properties of the sample at a low temperature Constant temperature device.
[Phase Transition Temperature Analyzer]: The phase change temperature analyzer PCA is based on the large difference in the optical properties (reflected light power) of the material before and after the phase change. Under program temperature control, a laser beam of constant power is used to irradiate the surface of the sample , Record the reflected light power change, form the reflected light power and temperature change curve, so as to determine the phase transition temperature.
[Portable Zebeck coefficient tester]: The portable Zebeck coefficient tester PTM is a professional instrument for testing the Seebeck coefficient (normal temperature) of thermoelectric materials. This instrument can be used to quickly test the Seebeck coefficient of thermoelectric materials of different forms, such as films, blocks, and fibers, and provide a more professional and portable new choice for the scientific research of thermoelectric materials and the improvement of industrial efficiency.
[Hall effect test system]: The Hall effect test system HET is based on the Van der Pauw method to measure the electrical transport performance parameters of materials: carrier concentration, mobility, resistivity, Hall coefficient, etc., thin film or thin layer materials are all Measurable, can be applied to all semiconductor materials, including Si, ZnO, SiGe, SiC, GaAs, InGaAs, InP, GaN (N-type & P-type can be measured), widely used in domestic universities, research institutes, semiconductors, metals, high heat Lead organic new materials and other industries.
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