The optical power thermal analyzer is the world's first nano-scale thin-film material physical property analyzer, which fills the international technical gap in the non-destructive testing of the phase transition temperature and thermal expansion coefficient of nano-scale thin film materials! Not only can be used to detect bulk, but also thin film materials as low as 1nm. The phase transition temperature of the material is detected according to the characteristics of the large difference between the optical properties (reflected light power) before and after the phase change of the material, and the thermal expansion coefficient of the light-transmitting material is detected according to the principle of optical interference. It combines the phase change temperature analyzer and the thermal expansion coefficient analyzer. Two functions.