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【Special Topic 1 of Jiayitong Series Products】The first choice for material research-thin film thermal conductivity test system
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- Time of issue:2018-03-19
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(Summary description)Special introduction of Jiayitong film thermal conductivity series products
【Special Topic 1 of Jiayitong Series Products】The first choice for material research-thin film thermal conductivity test system
(Summary description)Special introduction of Jiayitong film thermal conductivity series products
- Categories:News
- Author:
- Origin:
- Time of issue:2018-03-19
- Views:61
Thin film thermal conductivity has obtained 2 invention patents, patent number: 201710832672.2 patent number: 201810067584.2
Thin film thermal conductivity has obtained 2 utility model patents, patent number: 201720505805.0 patent number 201720511457.8
A few days ago, three domestic first-class scientific research institutions have selected Jiayitong’s thin film thermal conductivity test system as their professional instrument for testing the thermal conductivity of thin film materials. There are also dozens of colleges and research institutes in cooperation with Jiayitong. Negotiate and purchase. Jiayitong film thermal conductivity test system has become the best choice for domestic first-class scientific research institutions!
The film thermal conductivity test system adopts the 3ω test method, which effectively overcomes the heat radiation phenomenon on the sample surface, and can well test the thermal conductivity of micro/nano film materials. It can be widely used to assist the research and development of various functional thin film materials, including integrated circuit heat dissipation materials, aerospace materials, thermoelectric materials and devices, information storage and optoelectronic devices, etc. At present, it has won unanimous recognition from units including the Shanghai Institute of Microsystem and Information Technology of the Chinese Academy of Sciences, Jiaxing College, and third-party testing institutions.
“3ω test method”
The metal strip is etched on the surface of the sample, and a current with a frequency of ω is passed through the two ends of the metal strip. The two electrodes in the middle of the metal strip generate a small voltage signal V3ω with a frequency of 3ω. The thermal conductivity is derived indirectly from V3ω.
“Product Details”
Can test the thermal conductivity of thin film materials
1. This system does not directly measure the temperature change, but realizes the thermal conductivity of the micro/nano thin film material and the microvolt level voltage value by measuring the change of the electrical signal converted from the temperature change of the material during the heat conduction process to ensure the measurement result High accuracy;
2. Adopt alternating current heating method, and at the same time select and optimize the shape and size of the heating electrode, which can ensure the uniformity of heating and the versatility, accuracy and stability of the test application;
3. The 3ω test method can effectively overcome the heat radiation phenomenon on the sample surface.
The system realizes automatic adjustment function
1. The resistance value can be automatically adjusted under conventional test methods;
2. The system cooperates with the software to realize automatic bridge balance;
3. The operation is safe and convenient, and the user experience is optimized.
Professional thin film thermal conductivity test software
Obtained national software copyright protection (registration number: 2016SR273937)
1. It can realize automatic testing of substrate thermal conductivity, sample thermal conductivity and substrate thermal diffusivity under normal temperature and variable temperature;
2. Realize the one-key bridge balance function, and can automatically test the metal resistivity under variable temperature conditions;
3. It can analyze the change curve of thermal conductivity and temperature T;
4. You can quickly view the results and automatically save the Excel format file;
5. Standardized software interface, convenient operation, fast switching between Chinese and English.
“success case”
Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences
The Shanghai Institute of Microsystems and Information Technology, Chinese Academy of Sciences was formerly known as the Shanghai Institute of Metallurgy, Chinese Academy of Sciences.
On December 20, 2017, the "Film Thermal Conductivity Test System (TCT)" of Wuhan Jiayitong Technology Co., Ltd. completed the installation, commissioning and explanation training of the instrument in Shanghai, and successfully passed the product acceptance, and was officially delivered to Shanghai Microelectronics of Chinese Academy of Sciences Used by the system! After several months of use, the Shanghai Institute of Microsystems, Chinese Academy of Sciences has recognized the Jiayitong products, which can directly measure the thermal conductivity of micro-nano-scale thin film materials.
Jiaxing University
Jiaxing University (Jiaxing University), abbreviated as Jiayuan, is a general undergraduate university formed by the merger of the former Zhejiang Economic College and Jiaxing College with the approval of the Ministry of Education in March 2000. Based on the management system.
On October 28, 2017, the "Film Thermal Conductivity Test System (TCT)" of Wuhan Jiayitong Technology Co., Ltd. completed the installation, debugging and training of the instrument at Jiaxing College-School of Mechanical and Electrical Engineering! After several months of using the School of Mechanical and Electrical Engineering, the teacher said that Jiayitong's products can directly measure the thermal conductivity of nano-scale thin film materials at this moment, which solved their major problem and once again expressed their recognition of Jiayitong.
China Academy of Engineering Physics
China Academy of Engineering Physics, referred to as "Chinese Academy of Physics", is China’s only nuclear weapons research and production unit listed in the national scientific research plan. , A comprehensive research institute integrating production.
In June 2017, Jiayitongke and China Academy of Engineering Physics signed a contract for the purchase of a thin film thermal conductivity test system (TCT), which is in urgent need of delivery.
“Technical Parameter”
Model |
TCT-CL |
TCT-RT |
TCT-HT |
temperature range |
150K~RT |
RT |
RT-500K |
Test object |
Semiconductor film, conductive film, insulating film, etc. |
||
Thermal conductivity measurement range |
0.1-10W/(m·k) |
||
|
±5% (measured on Si), ±10% (other) |
||
Suitable for atmosphere |
vacuum |
||
Sample size |
Length x Width: (5-10)x(5-10), unit mm, film thickness ≥10nm |
||
Other matters needing attention |
When measuring conductive films, an insulating layer (recommended: SiO2) needs to be deposited. The surface of the film should be very smooth to ensure that the insulating layer does not leak; the thermal conductivity of the substrate should be much greater than the thermal conductivity of the film. High thermal conductivity substrates such as Si and AIN are recommended. . |
||
Host size |
710 x 600 x 490,mm |
||
weight |
80kg |
“Test Case”
Measure results of thermal conductivity of SiO2 film under different currents at room temperature |
Test results of thermal conductivity of SiO2 film at different temperatures |
Test results of thermal conductivity of SiO2 film at different temperatures
|
Test results of thermal conductivity of GeTe/Bi2Te3 superlattices with different thicknesses at the same temperature |
The change of thermal conductivity of GeTe/Bi2Te3 superlattice at different temperatures |
Thermal conductivity of GeTe/Bi2Te3 superlattice sample and substrate at different temperatures |
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