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Thermal Expansion Coefficient Analyzer (TEA)

The thermal expansion coefficient analyzer adopts innovative patented technology of optical interference principle, which can non-destructively detect the thermal expansion coefficient of transparent materials of block and thin film samples. It is widely used to assist various new materials, especially the research and development and quality inspection of thin film materials.
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Model TEA-300 TEA1200 TEA-1800
Temperature Range RT~300℃ RT~1200℃ RT~1800℃
Program Temperature Repeatability Deviation <1.0%
Program Heating Rate Deviation <1.0%
Thermal Expansion Coefficient Measurement Precision Deviation <4.5%
Thermal Expansion Coefficient Measurement Accuracy Deviation <±15%
Maximum Working Power 4.0kw
Maximum Heating Rate 50°C/s (50°C~1200°C, Vacuum Atmosphere),45°C/s°C/(50°C~1200°C, N₂ Atmosphere)
Temperature Consistency ±2.0℃(1200℃,Vacuum),±4.5℃(1200℃,N₂)
Cooling Requirements Water Cooling
Thermal Expansion Resolution 266nm

 

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Features
● Products with independent intellectual property rights, with a number of technical patents
● Innovative technology based on the principle of optical interference, through the interference of the two reflected lights generated on the upper and lower surfaces of the sample, the curve of optical power versus temperature is obtained, and the thermal expansion coefficient of the material is obtained by calculation
● Infrared heating mode controlled by the combination of PID adjustment and fuzzy control, continuous large temperature zone, high-speed temperature follow-up, preset program heating and maintaining control
● Non-contact non-destructive testing, high test accuracy.
● Equipped with external vacuum equipment, circulating water cooling equipment and carrier gas or refrigeration capabilities.

 

Keyword:
Thermal expansion
thin film materials
non-destructive testing
new materials
Wuhan Jiayitong
Jiayitong Technology

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