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Thin Film Thermoelectric Parameter Test System (MRS-3RT RT)

In order to solve the increasingly urgent energy crisis, various new energy sources such as solar energy, wind energy, and nuclear energy have been continuously developed and utilized. The use of new energy requires high-quality energy-saving materials. The refrigeration and power generation system made of thermoelectric materials has many advantages such as small size, light weight, no mechanical noise, and no environmental pollution. Therefore, the research on thermoelectric materials is very important. In order to further improve the conversion efficiency of thermoelectric materials (thermoelectric figure of merit), research on it has slowly shifted from bulk to thin-film materials.
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Model MRS-3 MRS-3RT
Temperature Range 100K~700K RT
Temperature Control Method PID Program Control \
Vacuum ≤ 1Pa \
Test Atmosphere Vacuum Air
Measuring Rang Zebeck Coefficient: S ≥ 8µV/K; Resistivity: 0.1µΩ•m ~ 106µΩ•m
Resolution Seebeck Coefficient: 0.05µV/K; Resistivity: 0.05µΩ•m
Relative Error Seebeck Coefficient ≤ ±7%, Resistivity ≤ ±10%
Measurement Mode Automatic
Sample Size Length x Width: (10~18)x(4~14) (mm), Film Thickness ≥50nm
Host Size Collection Box:470x400x140(mm)      170x250x220(mm)
Variable Temperature Device: Diameter x Height 460x800 (mm)
Weight 31.9kg 3.5kg

 

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Features
● Specifically for Seebeck coefficient and resistivity measurement of thin film materials.
● The test environment temperature range reaches 81K~700K.
● The Seebeck coefficient is measured by the dynamic method, which avoids the systematic error of the static measurement in the temperature difference measurement, and the measurement is more accurate.
● Adopt four-wire method to measure resistivity.
● The clamp design facilitates sample replacement and improves efficiency.
● The software is easy to operate and intelligent, which can realize fully automatic mode.
Applications
● Seebeck effect
● Peltier effect
Customer Case
● Ningbo University
● Institute of Chemistry, Chinese Academy of Sciences
● Shenzhen University
● Wuhan University
Keyword:
Thermoelectric figure of merit
Seebeck coefficient
resistivity test
high vacuum
PID program control

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