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Thin Film Thermal Conductivity Test System (TCT-RT)

The 3ω test method is used to detect the thermal conductivity of the heater by using the heat conduction of the micro/nano film material to cause the change of the heater's electrical signal. It can verify the thermal conductivity performance difference of thin film materials at room temperature. The main application scope is the thermal conductivity measurement of micro/nano thin film materials, which can be widely used to assist the research and development of various functional thin film materials. Its coverage includes integrated circuit heat dissipation materials, aerospace materials, thermoelectric materials and devices, and information storage And optoelectronic devices, etc.
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Model TCT-CL TCT-RT TCT-HT
Temperature Range 150K~RT RT RT-500K
Test Object Semiconductor Film, Conductive Film, Insulating Film, etc.
Thermal Conductivity Measurement Range 0.1-10W/(m·K)(Expandable to 2000W/(m·K))
Test Accuracy (Thermal Conductivity) ±5% (measured on Si substrate), ±10% (other substrates)
Suitable For Atmosphere Vacuum
Sample Size Length x Width: (5-10)x(5-10) (mm), Film Thickness ≥10nm
Other Matters Needing Attention When measuring conductive films, an insulating layer (recommendation: Sio2) needs to be deposited. The surface of the film should be very smooth to ensure that the insulating layer does not leak; the thermal conductivity of the substrate should be much greater than the thermal conductivity of the film. High thermal conductivity substrates such as Si and AIN are recommended. .
Host Size 710 x 600 x 490(mm)
Weight 80kg

 

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Features
● The thin film thermal conductivity test system TCT uses the 3ω test method to detect the thermal conductivity of the heater's electrical signal changes caused by the heat conduction of the micro/nano thin film materials.
● It does not directly measure the temperature change, but realizes the thermal conductivity test of the thin film material by measuring the electrical signal change caused by the temperature change of the material during the heat transfer process.
● High-precision digital source meter combined with phase-locked amplification technology to ensure the accuracy of measurement results.
● The optimized shape and size design of the heating electrode can ensure the uniformity of heating and the stability of the test application.
 
 
 
 
Applications
● Heat dissipation material
● Thermoelectric materials
● Thermal resistance material
● Information storage materials
Customer Case
● Xi'an Jiaotong University
● Huazhong University of Science and Technology
Keyword:
Thermal conductivity test
3ωtest
thermal resistance material test
thermoelectric material test
optoelectronic material test

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